But, how tests are done differs from what bills face: Large curve radius, slow curving, nothing sharp poking at it in the middle. Basically the opposite of what is going on in tight pockets/purses.
> NFC chip bears most of the brunt here and not the secure element.
Unless the dielectric over your secure element is some previously unknown type, a few kilovolts will arc right through it and hit your secure element.
The 6,000 number is creasing the kapton 180º over the course of half a second with the 6mm curve radius. Copper breaks but not the lines critical for validation.
Our goal wasn't to make this thing indestructible, it was to figure out where the bar was for "good enough".
USD benchmarks are roughly:
4000 folds
2 years lifetime (low denomination)
8 years lifetime (high denomination)
30 transactions before decirculation
For Kong we aimed for:
6000 folds
10 years lifetime
unknown number of transactions before decirculation. (Unknowable)
Survives a wash
I think it's sufficient for what Kong is now but we have ideas for improvement and I would love here yours. Specifically anything we could do on the ESD side.
We've met before years ago but if you would like to get some to play with please email me.
yup. with you so far
> FPC lasts about 6,000
But, how tests are done differs from what bills face: Large curve radius, slow curving, nothing sharp poking at it in the middle. Basically the opposite of what is going on in tight pockets/purses.
> NFC chip bears most of the brunt here and not the secure element.
Unless the dielectric over your secure element is some previously unknown type, a few kilovolts will arc right through it and hit your secure element.